(Mastering JMP) Making the Best Choice for Defect Count Models скачать в хорошем качестве

(Mastering JMP) Making the Best Choice for Defect Count Models

Defect counts that are used as response variables often violate assumptions that must be met for standard least squares regression models to be successful. Instead, see how to develop a useful statistical model using Generalized Regression. This example has a goal to minimize defect counts in a chemical mechanical planarization (CMP) semiconductor manufacturing process. 00:00:00 Thinking About the Cost of Defects 03:45:04 Understanding Semiconductor CMP Case Study and Data 05:22:00 Starting with Standard Least Squares Report 06:56:10 Interpreting Defect Actual by Predicted Plot 07:35: 29 Summarizing Advantages of Generalized Regression Model Approach See the full video to find the best approach: https://community.jmp.com/t5/Learn-JM...