Reliability Issues and IC Failure in VLSI CMOS Technology скачать в хорошем качестве

Reliability Issues and IC Failure in VLSI CMOS Technology

This informative video meticulously examines various pivotal aspects surrounding the reliability of VLSI CMOS technology. It initiates with a comprehensive discussion on the concept of reliability, providing viewers with a foundational understanding. Following this introduction, the video delves into two distinct segments covering Reliability Factors, providing a thorough exploration of the primary elements influencing reliability in semiconductor devices. Subsequently, the video scrutinizes the intricate mechanisms underlying failures in VLSI CMOS technology, including Time Dependent Dielectric Breakdown (TDDB) and the phenomena of Negative Bias Temperature Instability (NBTI) presented in two parts. Additionally, the video explores critical topics such as Hot Carrier Injection, Soft Errors, Electromigration, Self Heating, Stress Migration, CMOS Latchup, and Electro Static Discharge (ESD), elucidating the complexities associated with each phenomenon to enhance the audience's comprehension. Read This As Text @ https://www.techsimplifiedtv.in/2024/... MileStone 1: High-K Dielectric -    • Unlocking VLSI Technology Advancements wit...   MileStone 2: SOI MOSFET -    • Exploring SOI MOSFET: Key Milestones in VL...   MileStone 3: Poly Silicon Gate -    • Unlocking VLSI Technology Milestones with ...   MileStone 4: Strained Silicon -    • Exploring Milestones in VLSI Technology: U...   MileStone 5: FinFET -    • Exploring FinFET Technology: Milestones in...   MileStone 6: MLM/Cu Interconnect/Low-K -    • Multi Level Metallization /Copper Intercon...   MileStone 7: Multi Pattern Lithography -    • Multi Pattern Lithography : Landmark in VL...   Variability in VLSI :    • Impact of Variability in VLSI Technology !   Reliability in VLSI :    • Reliability Issues and IC Failure in VLSI ...   Chapters for easy navigation: 00:00 Beginning & Intro 00:33 Chapter Index 01:17 What is Reliability? 06:17 Reliability Factors - I 09:25 Reliability Factors - II 11:26 Failure Mechanism 11.28 Time Dependent Dielectric Breakdown (TDDB) 14:04 Negative Bias Temperature Instability (NBTI)-I 17:31 Negative Bias Temperature Instability (NBTI)-II 20:36 Hot Carrier Injection 24:35 Soft Error-I 27:31 Soft Error-II 29:36 Electromigration (EM) 32:02 Self Heating 34:23 Stress Migration 37:24 CMOS Latchup 39:08 Electro Static Discharge (ESD) #vlsitraining #vlsidesign #vlsi Courtesy: Sound by : YouTube Music & Bensound.com Video by imotivation from Pixabay Image by Jorge Guillen from Pixabay Image by robtowne0 from Pixabay Image by Robin Higgins from Pixabay Image by Samuel Faber from Pixabay Photo by Tim Gouw from Pexels Photo by Dom J from Pexels Image by pngegg.com Image by testandmeasurement.com Image by Ferenc Keresi from Pixabay The Mission of TechSimplifiedTV is inspired from philosophy of : ‪@SatishKashyapB‬ ‪@iit‬ ‪@nptel-nociitm9240‬ ‪@npteliitguwahati8283‬ ‪@NPTELSpecialLectureSeries‬ ‪@IITKanpurNPTEL‬ ‪@nptel-indianinstituteofsci8064‬ ‪@NPTELGATEPreparation‬ ‪@interactivesessionswithiit7882‬ ‪@NPTELANSWERS‬ ‪@swayam-nptelofficeiitkhara474‬ This video suggests: "Understanding the reliability of VLSI CMOS technology" "Key reliability factors in semiconductor devices" "Primary elements influencing reliability in VLSI CMOS" "Mechanisms underlying failures in VLSI CMOS technology" "Time Dependent Dielectric Breakdown (TDDB) in CMOS circuits" "Negative Bias Temperature Instability (NBTI) explained" "Hot Carrier Injection and its impact on CMOS reliability" "Soft errors and their effect on VLSI CMOS performance" "Electromigration and its role in CMOS failure mechanisms" "Understanding Self Heating in semiconductor devices" "Stress migration and its impact on VLSI circuits" "CMOS Latchup and its influence on circuit reliability" "Electrostatic Discharge (ESD) in VLSI technology" "Reliability challenges in VLSI CMOS technology" "Detailed discussion on reliability factors in semiconductor design" "How TDDB and NBTI affect CMOS devices" "Exploring the complexities of hot carrier injection in VLSI" "Advanced explanations of soft errors in CMOS circuits" "Techniques for managing electromigration in semiconductor devices" "Video guide to understanding reliability issues in VLSI CMOS technology"