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In the current age of nanotechnology, novel materials are engineered from the nano to the atomic scale—extending to a wide class of applications such as fuel cells, batteries, solar energy, transistors, and computer memory. Understanding the behavior and controlling the growth of nanostructured materials requires high-resolution characterization. In an electron microscope, the small wavelengths of a swift electron beam provides a powerful tool for seeing the atomic structure of matter. One can not only directly image the constituent atoms but also extract chemical and bonding information and perform 3D tomographic reconstructions. Most recently, the advent of aberration-corrected electromagnetic lenses has made it possible to image individual atoms with sub-Angstrom detail—bringing new opportunities and challenges for high-resolution electron microscopy. In this introduction I will present the capabilities, the limits, and present a few applications for the measurement of nanoscale structures with these new microscopes.