Low-Resistance Measurements with the M81-SSM скачать в хорошем качестве

Low-Resistance Measurements with the M81-SSM

Try this Lock-in amplifier technique for low-resistance measurements with the M81-SSM! Jason Chonko demonstrates the lock-in amplifier technique with the M81-SSM. This lock-in amplifier technique allows you to minimize the amount of power delivered to the device under test (DUT) and prevent self-heating, which can be critical in cryogenic environments. Our test setup contains a 10 mΩ resistor device, we show a four-wire resistance measurement using the system’s balanced current source module (BCS-10) to source current through the DUT and then using the voltage measure module (VM-10) to measure voltage. We first perform a DC measurement and show that offset errors can become a significant issue, especially as the source and measure values become a smaller portion of the available ranges. We then switch to a lock-in amplifier measurement technique to minimize the amount of power delivered to the DUT and obtain more accurate values in low-resistance measurements. The M81-SSM is unique in that it can do both DC and lock-in amplifier measurements, all at the touch of a button. Resources ► How to Choose a Lock-in Amplifier: https://hubs.li/Q02TvXBz0 ► The Lock-in Amplifier Explained and Reimagined: https://hubs.li/Q02F5MLF0 00:00 Introduction 00:58 Four-wire measurement setup with the M81-SSM 01:15 Measuring current source 02:38 DC measurement error 03:42 Lock-in technique for low-resistance 04:49 Lock-in measurement 06:09 Minimizing current 06:24 Challenges of lowering a current 06:39 Conclusion _________________________________________________ Lake Shore Cryotronics M81-SSM product page: https://www.lakeshore.com/M81 Lake Shore Cryotronics on LinkedIn:   / mycompany