[2025 short course] Reliability of Semiconductor Devices: Si to More-than-Moore technologies скачать в хорошем качестве

[2025 short course] Reliability of Semiconductor Devices: Si to More-than-Moore technologies

Lecturer: Prof. Tian-Li Wu (National Yang Ming Chiao Tung University) 國立陽明交通大學電子所暨電機工程學系吳添立教授 Full course name: Reliability and Failure Physics of Semiconductor Devices: From Silicon to More-than-Moore technologies 半導體元件的可靠度與失效物理：從矽技術到超越摩爾技術（More-than-Moore Technologies） In this short course, the statistical tools and characterization methods for reliability evaluation are covered. Furthermore, two most important main reliability challenges (Time dependent dielectric breakdown and Bias temperature instability & interface traps ) will be addressed in this class. Last, reliability challenges in More-than-Moore devices, such as GaN/SiC wide bandgap technologies, will be discussed as well. Structure Unit 1 Overview of Reliability in Electronics Devices Unit 2 The Mathematics of Failure-and-Reliability Unit 3 Time dependent dielectric breakdown Unit 4 Interface charges & Bias Temperature Instability Unit 5 Reliability Challenges in More-than-Moore Devices (GaN/SiC wide bandgap technologies) Stay tune for more details! #半導體 #陽明交大 #吳添立 #Semiconductor #Reliability #NYCU #TianLiWu