COSIC seminar - An In-depth and Black-Box Characterization of the Effects... (Arthur Beckers) скачать в хорошем качестве

COSIC seminar - An In-depth and Black-Box Characterization of the Effects... (Arthur Beckers)

COSIC seminar - An In-depth and Black-Box Characterization of the Effects of Laser Pulses on ATmega328P - Arthur Beckers (KU Leuven) Laser fault injection is a complex, physical process with many parameters that influence the success of the injection. Some parameters are difficult to control. While many works have established that focused laser light can inject seemingly random faults in electronic devices such as microcontrollers, FPGAs and ASICs, only few works explain precisely why a specific fault can be observed. We narrow this gap and characterize in detail the effects of laser pulses on an 8-bit microcontroller in a black-box fashion, with access to only public documentation. With our setup and settings we can inject faults only in the read-out circuitry for the on-chip flash memory. As result of our analysis we are able to inject bit-reset faults in individual bits of opcodes and data words stored in flash with 100% accuracy and repeatability. This allows us to easily demonstrate well known attacks on cryptographic software, e.g. manipulation of a block cipher implementation’s number of rounds. At the same time our study informs the targeted development of countermeasures. Tags: #H2020 #ERC #Cathedral #CathedralERCAdvancedGrant695305