Π£ Π½Π°Ρ Π²Ρ ΠΌΠΎΠΆΠ΅ΡΠ΅ ΠΏΠΎΡΠΌΠΎΡΡΠ΅ΡΡ Π±Π΅ΡΠΏΠ»Π°ΡΠ½ΠΎ nanoHUB-U Fundamentals of AFM L2.5: Tip-Surface Interactions (Contact) - Contact Mechanics ΠΈΠ»ΠΈ ΡΠΊΠ°ΡΠ°ΡΡ Π² ΠΌΠ°ΠΊΡΠΈΠΌΠ°Π»ΡΠ½ΠΎΠΌ Π΄ΠΎΡΡΡΠΏΠ½ΠΎΠΌ ΠΊΠ°ΡΠ΅ΡΡΠ²Π΅, Π²ΠΈΠ΄Π΅ΠΎ ΠΊΠΎΡΠΎΡΠΎΠ΅ Π±ΡΠ»ΠΎ Π·Π°Π³ΡΡΠΆΠ΅Π½ΠΎ Π½Π° ΡΡΡΠ±. ΠΠ»Ρ Π·Π°Π³ΡΡΠ·ΠΊΠΈ Π²ΡΠ±Π΅ΡΠΈΡΠ΅ Π²Π°ΡΠΈΠ°Π½Ρ ΠΈΠ· ΡΠΎΡΠΌΡ Π½ΠΈΠΆΠ΅:
ΠΡΠ»ΠΈ ΠΊΠ½ΠΎΠΏΠΊΠΈ ΡΠΊΠ°ΡΠΈΠ²Π°Π½ΠΈΡ Π½Π΅
Π·Π°Π³ΡΡΠ·ΠΈΠ»ΠΈΡΡ
ΠΠΠΠΠΠ’Π ΠΠΠΠ‘Π¬ ΠΈΠ»ΠΈ ΠΎΠ±Π½ΠΎΠ²ΠΈΡΠ΅ ΡΡΡΠ°Π½ΠΈΡΡ
ΠΡΠ»ΠΈ Π²ΠΎΠ·Π½ΠΈΠΊΠ°ΡΡ ΠΏΡΠΎΠ±Π»Π΅ΠΌΡ ΡΠΎ ΡΠΊΠ°ΡΠΈΠ²Π°Π½ΠΈΠ΅ΠΌ Π²ΠΈΠ΄Π΅ΠΎ, ΠΏΠΎΠΆΠ°Π»ΡΠΉΡΡΠ° Π½Π°ΠΏΠΈΡΠΈΡΠ΅ Π² ΠΏΠΎΠ΄Π΄Π΅ΡΠΆΠΊΡ ΠΏΠΎ Π°Π΄ΡΠ΅ΡΡ Π²Π½ΠΈΠ·Ρ
ΡΡΡΠ°Π½ΠΈΡΡ.
Π‘ΠΏΠ°ΡΠΈΠ±ΠΎ Π·Π° ΠΈΡΠΏΠΎΠ»ΡΠ·ΠΎΠ²Π°Π½ΠΈΠ΅ ΡΠ΅ΡΠ²ΠΈΡΠ° ClipSaver.ru
Table of Contents: 00:09 Lecture 2.5: Contact Mechanics Predict the stresses and ... 01:17 Action of a point force (Boussinesq, 1885) 02:33 Action of a punch with circular cross-section 03:27 Action of a cone-shaped punch 04:16 At a microscopic scale, for small indentations. . . . 05:07 The basic problem 06:51 Need to Develop a Tip-sample Interaction Model 08:31 elastic, with adhesion in contact region 10:29 Surface forces give rise to surface energies 12:37 Standard results 15:33 JKR Adhesion - consequences 17:47 Example 21:10 Which contact model to choose? 22:05 Validity of different models 23:27 Transition from DMT to JKR: Maugis-Dugdale Theory 24:59 Up Next: Combining contact mechanics with intermolecular interactions This video is part of nanoHUB-U's course Fundamentals of Atomic Force Microscopy: Part 1 Fundamental Aspects of AFM. (https://nanohub.org/courses/AFM1) Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates. The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy. Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.