Electrostatic Discharge Challenges as Semiconductor Integration Increases in Electronic Systems скачать в хорошем качестве

Electrostatic Discharge Challenges as Semiconductor Integration Increases in Electronic Systems

Electrostatic discharge is an unavoidable phenomenon in our everyday lives. There is an engineering engine behind the scenes ensuring that the electronic systems we rely on are not sensitive to damage by ESD. This seminar is an introduction to ESD where we will explore some for the techniques that manage the ESD risk at system level and also at integrated circuit level. Dr. Ann Concannon is a Distinguished Member of Technical Staff at Texas Instruments, working in the Analog ESD group, with technology development teams, design teams and external customers to engage early on ESD challenges on projects with high visibility on execution and revenue opportunities. As a Marie Curie Fellow in 1996, she worked on joint silicon device development projects with European Industry, including NXP and ST, and led a research group at the Tyndall Institute in Ireland. After joining National Semiconductor in 2000, and subsequently Texas Instruments in 2011, Ann has been based in Santa Clara, CA, USA where she has focused on ESD and Power device SOA. Ann is a senior member of the IEEE, and an active member of the ESDA, with many publications and patents in NVM, Si and ESD. In 2017, Ann was elected to the board of the ESDA, and is a founding member of the Bay Area ESD group; a member of the ESDA education committee and is on the EOS/ESD symposium steering committee.