Texture, Strain and Residual Stress Analysis of Crystalline Materials Using XRD by Hamid Garmestani скачать в хорошем качестве

Texture, Strain and Residual Stress Analysis of Crystalline Materials Using XRD by Hamid Garmestani

From the 2023 Georgia Tech Symposium & Workshop Learn more at: https://rigaku.com/resources/events/g... Understanding the microstructural evolution of polycrystalline materials under mechanical and thermal processing is essential for optimizing performance in both metals and crystalline polymers. This presentation explores the interplay between crystallographic texture, strain (both uniform and non-uniform), and residual stress, with an emphasis on their quantification using X-ray diffraction (XRD) and complementary techniques such as electron backscatter diffraction (EBSD). Dr. Garmestani outlines foundational concepts of texture as orientation distribution functions (ODFs), introduces stereographic and pole figure analysis, and discusses mathematical models used to extract meaningful microstructural parameters. Applications range from deformation-induced texturing in metals to layer-by-layer strain accumulation in additive manufacturing. Case studies include thin films, polymeric implants, and 3D printed components, highlighting how tailored texture and minimized residual stress can significantly improve properties such as wear resistance and magnetic response. The talk also underscores the critical role of simulation and verification in predicting microstructural outcomes from process parameters.