ASI Characterizing and removing system error in spherical measurements скачать в хорошем качестве

ASI Characterizing and removing system error in spherical measurements

As optical manufacturing pushes toward higher precision and tighter specifications, it is becoming increasingly common for optical surfaces to be specified with figure error requirements that exceed the accuracy of traditional reference surfaces. In this video, QED Technologies explains how the ASI (Aspheric Stitching Interferometer) stitching platform helps manufacturers meet the demands of modern, high-precision optical production. When surface specifications surpass the inherent accuracy of reference optics, it becomes essential to characterize and remove instrument system errors—particularly reference wave error—from the measurement process. Without this step, measurement artifacts can be misinterpreted as real surface errors. Using the ASI stitching platform paired with the QED QIS interferometer, we walk through a quick example showing how the system efficiently identifies and removes these errors, enabling more accurate surface measurements and confidence in ultra-precision optical metrology. Whether you’re measuring aspheres, spheres, or other high-performance optical components, this approach allows manufacturers to maintain measurement accuracy even as optical tolerances continue to tighten.