Скачать с ютуб F. J. Giessibl - Atomic force microscopy provides new vistas for nano- and picoscience в хорошем качестве

F. J. Giessibl - Atomic force microscopy provides new vistas for nano- and picoscience

Atomic force microscopy (AFM) and scanning tunneling microscopy (STM) image surfaces with atomic resolution enable local spectroscopies such as of current versus voltage and forces versus distance. In the past, STM and AFM used to be separate techniques that required their own instrumentation. While STM had better spatial resolution than AFM, the situation is now reversed with modern AFM. Very recently, AFM has provided important insights into inelastic tunneling spectroscopy [10] and superconductivity. In this seminar, we will review many exciting avenues in nanoscience research that are opening up today when combining both STM and AFM techniques. Franz Giessibl was the PhD student with Nobel Laureate Gerd Binnig at the IBM Physics Group Munich on atomic force microscopy. He continued experimental and theoretical work on the force microscope at the chair of Prof. Jochen Mannhart at University of Augsburg. In 2006, he joined the faculty at the University of Regensburg in Germany. Giessibl spent most of his professional career improving atomic force microscopy. His work has enabled atomic force microscopy to obtain subatomic spatial resolution on individual atoms and submolecular resolution on organic molecules.