Testing Von Neumann Debiasing in a Zener Noise RNG – Can Intention Influence Electronic Noise? скачать в хорошем качестве

Testing Von Neumann Debiasing in a Zener Noise RNG – Can Intention Influence Electronic Noise?

🔬 Electronic noise experiment running This video shows my experiment while it is running. The system uses electronic noise from a zener diode, which is amplified about 10,000 times. The signal is sampled using a Teensy 4.1 ADC, and I use the least significant bit (LSB) from each sample to generate a stream of random 0s and 1s. However, raw noise bits often contain a small bias. That means slightly more 0s than 1s (or vice versa) may occur, which can create a slow systematic drift in the measurements. To reduce this bias I am testing Von Neumann debiasing, a classic method for extracting unbiased bits from a biased random source. The method works like this: • 10 → output 1 • 01 → output 0 • 00 and 11 → discarded By only using bit pairs where a transition occurs, the method can theoretically remove systematic bias from the bitstream. The goal of this project is to investigate whether human intention alone can influence the statistical behavior of electronic noise, inspired by the experiments from the Princeton Engineering Anomalies Research (PEAR) laboratory. If no further errors are found in the setup, I plan to continue running longer measurement series to see whether any statistically significant deviations appear over time. It will be interesting to see what longer runs reveal. 🔍