IC-CAP Complete Measurement + Multi-Device Platform Innovations 2022 - Overview (Part 1) скачать в хорошем качестве

IC-CAP Complete Measurement + Multi-Device Platform Innovations 2022 - Overview (Part 1)

Introduction to what is unique, why is it innovative, and how to validate model/library predictability using IC-CAP device modeling platform applied to your Silicon-based or III-V device compact model extraction flow. Learn basic essentials of how to use PathWave software’s device modeling tools and services. Look at trends driving III-V technology and modeling challenges: Wide bandgap semiconductors, modeling trapping and thermal effects, Artificial Neural Network ANN modeling. Why you need a true device modeling characterization tool, not just tune all the parameters and hope for the best. To see full webinar on IC-CAP, see: Full webinar video on-demand + slides to download: https://connectlp.keysight.com/LP=338... Keysight University version: https://learn.keysight.com/pathwave-d... To apply for a Free Trial of any Keysight EEsof EDA PathWave software, please click on the following link: http://www.keysight.com/find/eesof-ev... For more details about PathWave Device Modeling (IC-CAP), please click on the following link: http://www.keysight.com/find/eesof-iccap Additional "How To" videos may be found on this YouTube channel and the Keysight EEsof EDA YouTube channel:    / keysighteesof   Already a supported customer? Be sure to see the latest on the EEsof Knowledge Center, too: http://www.keysight.com/find/eesof-kn...