FEI Velox: drift-corrected frame integration for TEM imaging скачать в хорошем качестве

FEI Velox: drift-corrected frame integration for TEM imaging

As you might expect, your S/TEM images won't look very good if the specimen isn't still during image acquisition. Of course, time is always your friend when it comes drift reduction, but even with sufficient time, the drift may still impact your data. For much of the history of S/TEM, there was no way around this issue, until drift-corrected frame integration (DCFI) was developed. Now widespread and ubiquitous in modern S/TEM imaging technology and software, DCFI has completely changed the game in terms of the quality of S/TEM images now obtainable. So, as promised (albeit a day late), here is the video tutorial covering the DCFI feature of FEI Velox as applied to conventional TEM mode imaging (as always, recorded raw, unedited, uncensored, unfiltered, and uncut). Thank you for your support, my fellow electron microscopy aficionados! Please like, subscribe, and share and leave any questions or comments you may have and I will do my best to reply as soon as possible. Video topic requests are always welcome and appreciated; I enjoy making these videos and wish I could make them more frequently, but the demands of my job make it tough to do so; I’m in charge of 3 S/TEMs, 2 dual FIB/SEM systems, and 1 SEM and this keeps me very busy! Connect with me on LinkedIn:   / nicholas-rudawski-30414528   Where I work: https://rsc.aux.eng.ufl.edu/ E-mail me directly: ngr@ufl.edu