Part 1: Fusion AX - Amp Up Your Devices, Studying Electronic Devices with In Situ TEM скачать в хорошем качестве

Part 1: Fusion AX - Amp Up Your Devices, Studying Electronic Devices with In Situ TEM

Dr. Zayna King | Product Specialist, Protochips Fusion AX is a complete in situ TEM solution designed to support the electrical and electrothermal characterization of a broad range of materials including nanoelectronics, semiconductor devices and a variety other 2D materials. Coupling Fusion AX’s in situ heating and biasing capabilities with the high-resolving power of the electron microscope, researchers can gain deeper insights into the nanoscale structure and performance of electronic devices in real time. By better understanding the properties of electronic devices such as chemical structure and conductivity, researchers can then inform the development of more reliable, durable and higher performing nanoelectronics with lower power consumptions. Dr. John Damiano | CTO, Protochips Dr. John Damiano will provide a background on in situ electrical characterization, how electrical characterization differs from ex situ measurements, the factors that determine success for in situ electrical, and provide some interesting examples of electrical characterization experiments.