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Abstract: This talk highlights the research & development of focused ion beam (FIB) techniques for micro and nano structuring novel mechanical and optical devices. It presents a deterministic FIB fabrication approach with an effort to compensate the divergence errors associated with the FIB processing technique, such as beam overlap, angular dependence of the sputter yield and a level set approach to predict generated surface topography in consideration of the ion redeposition effects. It also presents a novel micro and nanostrcutring approach based on FIB induced bending mechanism which is a very promising technique to create free standing micro/nano structure of desired shape for the next generation micro/nano devices. The talk will include several case studies including FIB polishing optical fibre interferometer and FIB nanostructuring single crystal diamond tools for scale up manufacturing of nano-gratings. Keywords: Microstructures, nanostructures, focused ion beam, sputter yield, beam bending. Full Article: https://www.proceedings.iaamonline.or... Join us: https://www.iaamonline.org/