Scanning Electron Microscopy (SEM) Lecture: Principles, Techniques & Applications скачать в хорошем качестве

Scanning Electron Microscopy (SEM) Lecture: Principles, Techniques & Applications

The KNI's Scanning Electron Microscopy lecture, presented by Matthew Sullivan Hunt, PhD (with an updated video intro). Lectures on Ga-FIB (   • Gallium Focused Ion Beam (Ga-FIB) Lec...  ) and He/Ne-FIB Microscopy (   • Helium & Neon Focused Ion Beam (He/Ne...  ) are also available. Download the lecture slides (with complete slide notes) from the KNI's Box Directory, https://bit.ly/2O5sN6e. Different versions of each microscopy lecture exist there, including this lecture version with videos embedded, and .pptx & .pdf versions without the videos but with several more slides (this lecture version has been condensed to fit into one hour). Download the KNI Microscopy Handouts discussed in the video: SEM Concepts: https://bit.ly/2Grnp95 SEM & Ga-FIB Alignments: https://bit.ly/38LoTaA Guide to Optimizing SEM Images: https://bit.ly/2RxQy8Z Ga-FIB Concepts: https://bit.ly/30XPSwZ He- & Ne-FIB Concepts: https://bit.ly/2O45j14 He- & Ne-FIB Alignments: https://bit.ly/3aMQvOj Note that all of the KNI's microscopy resources can be found in the Box directory (https://bit.ly/2uFnqne) and on individual instrument pages on the KNI Lab wiki (https://lab.kni.caltech.edu/index.php.... ___ Disclaimer: This video is intended to serve as supplemental information and cannot replace in-person instrument training. Caltech and KNI are not responsible for how the presented information is translated for use in other facilities. For information or questions about this video, contact [email protected]