ISCS23: The Advantages of Inpainting for High-resolution, In-situ and Ultrafast Electron Microscopy скачать в хорошем качестве

ISCS23: The Advantages of Inpainting for High-resolution, In-situ and Ultrafast Electron Microscopy

Keynote presentation from the first day of ISCS23 (iscs2023.com) "The Advantages of Inpainting for High-resolution, In-situ and Ultrafast Electron Microscopy" by Prof. Nigel Browning (University of Liverpool, UK) Abstract: For many imaging and microanalysis experiments using state-of-the-art aberration corrected scanning transmission electron microscopy (STEM), the resolution and precision of the result is primarily determined by the tolerance of the sample to the applied electron beam dose. In the case of in-situ experiments, where the goal is to image a chemical or structural process as it evolves, the effect of the beam dose can be harder to unravel, as a change in structure/chemistry is the expectation of the experiment. Recent results at the University of Liverpool have shown that the optimal solution for dose control in any form of scanning/transmission electron microscopy is to form the image from discrete locations of a small electron beam separated by as far as possible in space and time. Here I will discuss the methodology behind the use of Inpainting, with reference to the speed and efficiency of the reconstruction method and the potential for real-time imaging. In addition, the use of simulations to provide a starting point for image interpretation and the use of deep learning approaches to allow the microscope to adapt its own imaging conditions, will be demonstrated. Find more info at ISCS2023.com