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v3-S37. Course Description: This course explores the critical importance of yield enhancement in semiconductor manufacturing, focusing on strategies that improve production efficiency, reduce costs, and boost product quality. Participants will learn how yield—defined as the percentage of functional chips produced per wafer—directly influences profitability, time-to-market, and customer satisfaction. The course addresses key challenges such as defect management, contamination control, process variability, and equipment reliability, emphasizing their interconnected impacts on manufacturing performance. Learners will examine proven techniques for improving yield, including process optimization, statistical process control, automation, and smart maintenance. Advanced technologies such as AI, machine learning, digital twins, and edge computing are introduced as powerful tools for predictive analytics, anomaly detection, and adaptive manufacturing. The course also highlights real-time monitoring systems, economic ROI modeling, and future trends that are shaping the next generation of yield management. Designed for professionals seeking to optimize operations and drive innovation, this course provides the knowledge and tools necessary to achieve sustainable yield gains and remain competitive in the rapidly evolving semiconductor landscape.