Скачать с ютуб XPS Depth Profiling of Metal-Halide Perovskites в хорошем качестве

XPS Depth Profiling of Metal-Halide Perovskites

Choosing the right ion gun to perform a sputter depth profile for a given material system is always a challenge. In particular, mixed material systems, i.e., a mixture of inorganic and organic components, present either as different layers or mixed within a single layer, present a particular challenge. Monatomic Ar+ will cause significant damage to the organic component, while argon gas cluster beams will sputter organics significantly faster than inorganics. Developing methods to determine how to study these types of materials effectively is an ongoing process. In this video, we present one of these challenging mixed materials, organic-inorganic metal-halide perovskites.