AFM Techniques for Semiconductor Failure Analysis | Electrical, Thermal, Mechanical & Chemical Modes скачать в хорошем качестве

AFM Techniques for Semiconductor Failure Analysis | Electrical, Thermal, Mechanical & Chemical Modes

WATCH THE FULL WEBINAR: https://www.bruker.com/en/news-and-ev... Atomic force microscopy (AFM) is well known for its standard capability to image surface topography with nanometer-scale spatial resolution. One of its greatest advantages for failure analysis is the added ability to provide complementary nanoscale information about electrical, magnetic, thermal, and mechanical properties, as well as chemical identification. This webinar focuses on the electrical, thermal, mechanical, and chemical AFM modes most important for failure analysis. Watch this on-demand webinar to hear about AFM operating modes for failure analysis, with relevant information provided for each mode. -- 📲Stay connected with us!   / brukernano     / bruker-nano-inc-   #materialsscience #materialscience #afm