High-Precision Probe Station by SATs | Thin Film -- Electrical & Opto-Electrical Characterization скачать в хорошем качестве

High-Precision Probe Station by SATs | Thin Film -- Electrical & Opto-Electrical Characterization

Discover the SATs Advanced Probe Station, engineered for high-precision electrical and opto-electrical characterization of semiconductor devices and advanced materials. This probe station is designed to meet the demanding requirements of material science, semiconductor research, solar cells, thin films, gas sensors, diodes, FETs, and memory devices. With a robust mechanical design and user-friendly probe control, SATs probe stations deliver stable, repeatable, and accurate measurements for both academic and industrial R&D labs. 🔬 Key Features • High-precision manual micro-positioners • Compatible with vacuum and temperature-controlled measurements • Supports electrical and opto-electrical characterization • Quartz window option for optical excitation • Rugged SS construction for long-term stability • Customizable configurations based on research needs 🧪 Applications • Semiconductor device testing • Thin film characterization • Solar cell & photodiode analysis • Gas sensing measurements • Material science research • Academic & industrial R&D labs