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In this video Richard Sharp highlights the Single Event Effects (SEE) which are prevalent in space, for aerospace applications and even at ground level. At the same time, transistor dimensions have been scaled sufficiently that most digital devices are now sensitive to SEE unless mitigated. Unfortunately, the cost of testing at accelerators is high and beam time availability is poor. The confluence of these factors now makes laser SEE testing attractive. Pulsed lasers enable charge to be injected into semiconductor structures to mimic a strike by a charged particle. Using a laser SEE system enables excellent temporal and spatial information to be obtained. Testing is quick and low cost, making it ideal for the screening of parts, as well as product development. These attributes mean that the technique can help rule out major vulnerabilities and provide a level of radiation hardness assurance normally associated with big budget missions. While final qualification of systems may still use a cyclotron, laser SEE test systems can speed up development cycles dramatically, facilitate the rapid go/no go selection of parts, identify vulnerabilities and weak spots on a die and provide fault injection for a wide variety of applications. This presentation will cover the many advantages of laser SEE test systems, allowing the scope of radiation testing to extend beyond large space missions to CubeSats and down to ground level systems including automotive and railway engines