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Microgeometry Capture using GelSight

This video provides an overview of our SIGGRAPH 2011 paper. Abstract: We describe improvements to the GelSight system that bring the resolution capabilities into the microscopic domain. We can measure features as small as two microns spatially with submicron depth resolution. In contrast to existing microgeometry capture techniques, the system is not affected by the optical characteristics of the surface being measured - it captures the same geometry whether the object is matte, glossy, or transparent. We demonstrate two versions of the design: a bench configuration and a portable handheld device. For more information, please visit http://www.gelsight.com.