(Mastering JMP) Dive Into Accelerated Life Testing (ALT) for Product Reliability скачать в хорошем качестве

(Mastering JMP) Dive Into Accelerated Life Testing (ALT) for Product Reliability

When product reliability at use conditions is high, accelerated life tests (ALT) are necessary to reduce test time. By testing parts under more severe conditions, the failure time is much lower, so testing can be completed in a reasonable time. Then, the accelerated failure data can be used to predict product reliability at low stress. 00:00 Understanding The Principle of Accelerated Life Testing (ALT) 19:08 Using Arrhenius Constant Stress Model to Predict Lifetimes at Use Conditions 25:23 Using and Power Law (also called Log or Voltage) Constant Stress Model to Predict Lifetimes at Use Conditions 29:04 Using a Step Stress approach to Reduce Test time and Predict Reliability at Low Stress 42:00 Creating Create a Safe Operating Area (SOA) from Accelerated Life Data for Two Factors Video Q&A and JMP resources: https://community.jmp.com/t5/Masterin...