[22] PIC12F683 part 2: Decapsulation and delayering скачать в хорошем качестве

[22] PIC12F683 part 2: Decapsulation and delayering

In part 2 of the PIC12F683 series, we depackage several components using different techniques to obtain high resolution microscope imagery for use in future parts of the project. Part 1:    • [21] PIC12F683 part 1: Introduction and pa...   Part 3:    • [23] PIC12F683 part 3: Risk mitigation, fl...   00:00 - Introduction 00:13 - Partial decap theory 09:25 - Sample mounting and masking for partial decap 12:34 - Wet bench work for partial decap 19:38 - Microscope study of partial decap sample 28:45 - Wet bench work for bare die decap 33:02 - Deprocessing theory 41:57 - Wet etch montage 42:48 - Concluding remarks AI generated comments/summaries are considered spam and will be deleted.