TESTING | VLSI DESIGN | LECTURE 03 BY DR DIVYA SHARMA | AKGEC скачать в хорошем качестве

TESTING | VLSI DESIGN | LECTURE 03 BY DR DIVYA SHARMA | AKGEC

#AKGEC #AKGECGhaziabad #BestEngineeringCollege #BTech #MTech #MBA. In this lecture, Dr. Divya Sharma explains the fundamentals of Testing in VLSI Design with a clear focus on key concepts such as Defect, Fault, and Error. The session also introduces Ad-Hoc Design for Testability (DFT) and Scan Path Design, which are essential topics in modern VLSI systems. This lecture is designed to help students understand how testing is performed in VLSI circuits and why different types of testing are required during circuit design and fabrication. 🔹 Topics Covered: • Introduction to VLSI Testing • Defect, Fault, and Error in VLSI Circuits • Relationship between Defect, Fault & Error • Need for Testing in VLSI Design • Ad-Hoc DFT Techniques • Scan Path Design • Types of Testing in VLSI Do subscribe to the AKGEC channel & get regular updates on videos: For more information: Please write to us at [email protected] or call us at +91-8744052891 🔵 Website: https://akgec.ac.in 🔵 Facebook: / official.akgec 🔵 Instagram: / official.akgec 🔵 LinkedIn: / officialakgec 🔵 Twitter: / official_akgec --