Unveiling Atomic EDS Maps Acquisition: A Demonstration with Spectra Ultra TEM, Ultra-X and Velox скачать в хорошем качестве

Unveiling Atomic EDS Maps Acquisition: A Demonstration with Spectra Ultra TEM, Ultra-X and Velox

This video provides a demonstration of the sophisticated capabilities of the Spectra Ultra TEM, Ultra-X Detector, and Velox Software. The demonstration explores the analysis of a complex, multi-layered sample, composed of Barium Titanate (BaTiO3), Strontium Titanate (SrTiO3), and Lanthanum Manganite (LaMnO3). Special thanks to Prof Guus Rijnders, Prof Gertjan Koster and Prof Mark Huijben at the University of Twente and Dr Daen Jannis, Dr Nicolas Gauquelin and Prof Johan Verbeeck from EMAT at the University of Antwerp for sharing an interesting multi-layered sample. The demonstration highlights the effective use of Electron Dose Control (EDC) in facilitating optimal experimental setup, the ease of dose management with EDC, and fast sample tilting achieved through SmartCam's click-tilt functionality integrated within Velox. Experience the process of acquiring high-quality atomic STEM images and the significant improvement in image quality achieved by using Drift Corrected Frame Imaging (DCFI) in STEM. The demonstration highlights the seamless transition from STEM imaging to the acquisition of atomic resolution EDS maps using the Ultra-X in Velox, facilitated by a simple current switch. This demonstration captures the robust capabilities of the Spectra Ultra TEM, Ultra-X Detector, and Velox Software in handling intricate materials analysis tasks. Our aim is to help viewers to realize the full potential of Thermo Scientific TEMs. And special kudos to Rachel Osmundsen from the Thermo Scientific Americas NanoPort for her expertise and dedication in making this video.