nanoHUB-U Fundamentals of AFM L5.6: Dynamic AFM - Trends and Overview скачать в хорошем качестве

nanoHUB-U Fundamentals of AFM L5.6: Dynamic AFM - Trends and Overview

Table of Contents: 00:09 Lecture 5.6: Trends and Overview 00:17 From the last lecture 01:32 Trends in dAFM techniques 03:38 High speed 07:56 High speed - examples 10:23 Higher harmonic imaging in liquids 13:12 Bi-modal or dual AC AFM 14:46 Bimodal or Dual AC AFM 16:31 Peak force tapping 20:39 Peak force tapping -results 21:31 Conclusion This video is part of nanoHUB-U's course Fundamentals of Atomic Force Microscopy: Part 2 Dynamic AFM Methods. (https://nanohub.org/courses/AFM2) Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates. The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.