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Table of Contents: 00:09 Fundamentals of Atomic Force Microscopy Part 2: Dynamic AFM Methods 00:14 From the last lecture 01:15 Limitations of the linearized analysis 07:03 Linear vs. nonlinear freq.response 12:10 Analytical theory of dynamic AFM 15:17 Analytical theory of dynamic AFM 20:17 Analytical theory of dynamic AFM 23:15 Physical meaning of Ets 26:00 Physical meaning of Vts This video is part of nanoHUB-U's course Fundamentals of Atomic Force Microscopy: Part 2 Dynamic AFM Methods. (https://nanohub.org/courses/AFM2) Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates. The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.