An Open Systems Approach to BMS HIL Testing скачать в хорошем качестве

An Open Systems Approach to BMS HIL Testing

Hardware-In-the-Loop (HIL) testing is the standard approach to validating the design of xEV ECU systems including the battery management system (BMS) electronics and firmware. HIL test systems are used to simulate the battery including cell chemistry, charging and discharging, drive cycles, and numerous fault conditions for testing the BMS; without the hazards of real batteries, or the cost of prototype vehicles and track time. There exist vendor-defined or “closed”, as well as user-defined or “open” approaches to the implementation of HIL test equipment. In this session, Peter Blume, President of Bloomy, presents an open systems architecture approach to HIL test systems implementation using commercial off-the-shelf hardware and software. Additionally, Peter will present the benefits of the open system architecture, including greater flexibility, extensibility, and reduced cost, via case studies from market-leading xEV companies and suppliers. This presentation was recorded at the Advanced Automotive Battery Conference (AABC) in Detroit, MI on June 14, 2016.